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Author: Zhiping Luo Publisher: Momentum Press ISBN: 1606507044 Category : Technology & Engineering Languages : en Pages : 174
Book Description
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
Author: Zhiping Luo Publisher: Momentum Press ISBN: 1606507044 Category : Technology & Engineering Languages : en Pages : 174
Book Description
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
Author: Zhiping Luo Publisher: Momentum Press ISBN: 1606509187 Category : Technology & Engineering Languages : en Pages : 178
Book Description
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
Author: John Stirling Publisher: John Wiley & Sons ISBN: 1119973996 Category : Science Languages : en Pages : 492
Book Description
Diagnostic Electron Microscopy Diagnostic Electron Microscopy: A Practical Guide to Interpretation and Technique summarises the current interpretational applications of TEM in diagnostic pathology. This concise and accessible volume provides a working guide to the main, or most useful, applications of the technique including practical topics of concern to laboratory scientists, brief guides to traditional tissue and microbiological preparation techniques, microwave processing, digital imaging and measurement uncertainty. The text features both a screening and interpretational guide for TEM diagnostic applications and current TEM diagnostic tissue preparation methods pertinent to all clinical electron microscope units worldwide. Containing high-quality representative images, this up-to-date text includes detailed information on the most important diagnostic applications of transmission electron microscopy as well as instructions for specific tissues and current basic preparative techniques. The book is relevant to trainee pathologists and practising pathologists who are expected to understand and evaluate/screen tissues by TEM. In addition, technical and scientific staff involved in tissue preparation and diagnostic tissue evaluation/screening by TEM will find this text useful.
Author: Elaine Evelyn Hunter Publisher: Cambridge University Press ISBN: 9780521385398 Category : Medical Languages : en Pages : 210
Book Description
For this new edition, the chapters on photography and the electron microscope have been completely rewritten and two new chapters have been added--on immuno electron microscopy using colloidal gold and on useful specialized techniques.
Author: Anwar Ul-Hamid Publisher: Springer ISBN: 3319984829 Category : Technology & Engineering Languages : en Pages : 422
Book Description
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author: Stephen J. Pennycook Publisher: Springer Science & Business Media ISBN: 1441972005 Category : Technology & Engineering Languages : en Pages : 762
Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: Vlad Stolojan Publisher: Morgan & Claypool Publishers ISBN: 1681741202 Category : Technology & Engineering Languages : en Pages : 69
Book Description
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Author: P.E. Champness Publisher: Garland Science ISBN: 100014464X Category : Science Languages : en Pages : 223
Book Description
This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.
Author: Zhiping Luo
Author: Zhiping Luo
Author: Zhiping Luo
Author: Zhiping Luo
Author: John Stirling
Author: Elaine Evelyn Hunter
Author: Marc De Graef
Author: Anwar Ul-Hamid
Author: Stephen J. Pennycook
Author: Vlad Stolojan
Author: P.E. Champness