Author: Giorgio Celant Publisher: John Wiley & Sons ISBN: 111929228X Category : Mathematics Languages : en Pages : 254
Book Description
This book is the first of a series which focuses on the interpolation and extrapolation of optimal designs, an area with significant applications in engineering, physics, chemistry and most experimental fields. In this volume, the authors emphasize the importance of problems associated with the construction of design. After a brief introduction on how the theory of optimal designs meets the theory of the uniform approximation of functions, the authors introduce the basic elements to design planning and link the statistical theory of optimal design and the theory of the uniform approximation of functions. The appendices provide the reader with material to accompany the proofs discussed throughout the book.
Author: Giorgio Celant Publisher: John Wiley & Sons ISBN: 1848219954 Category : Mathematics Languages : en Pages : 292
Book Description
This book is the first of a series which focuses on the interpolation and extrapolation of optimal designs, an area with significant applications in engineering, physics, chemistry and most experimental fields. In this volume, the authors emphasize the importance of problems associated with the construction of design. After a brief introduction on how the theory of optimal designs meets the theory of the uniform approximation of functions, the authors introduce the basic elements to design planning and link the statistical theory of optimal design and the theory of the uniform approximation of functions. The appendices provide the reader with material to accompany the proofs discussed throughout the book.
Author: Giorgio Celant Publisher: Wiley-ISTE ISBN: 9781786300546 Category : Mathematics Languages : en Pages : 0
Book Description
This book considers various extensions of the topics treated in the first volume of this series, in relation to the class of models and the type of criterion for optimality. The regressors are supposed to belong to a generic finite dimensional Haar linear space, which substitutes for the classical polynomial case. The estimation pertains to a general linear form of the coefficients of the model, extending the interpolation and extrapolation framework; the errors in the model may be correlated, and the model may be heteroscedastic. Non-linear models, as well as multivariate ones, are briefly discussed. The book focuses to a large extent on criteria for optimality, and an entire chapter presents algorithms leading to optimal designs in multivariate models. Elfving’s theory and the theorem of equivalence are presented extensively. The volume presents an account of the theory of the approximation of real valued functions, which makes it self-consistent.
Author: Giorgio Celant Publisher: John Wiley & Sons ISBN: 1786300540 Category : Mathematics Languages : en Pages : 324
Book Description
This book considers various extensions of the topics treated in the first volume of this series, in relation to the class of models and the type of criterion for optimality. The regressors are supposed to belong to a generic finite dimensional Haar linear space, which substitutes for the classical polynomial case. The estimation pertains to a general linear form of the coefficients of the model, extending the interpolation and extrapolation framework; the errors in the model may be correlated, and the model may be heteroscedastic. Non-linear models, as well as multivariate ones, are briefly discussed. The book focuses to a large extent on criteria for optimality, and an entire chapter presents algorithms leading to optimal designs in multivariate models. Elfving’s theory and the theorem of equivalence are presented extensively. The volume presents an account of the theory of the approximation of real valued functions, which makes it self-consistent.
Author: G.Y. Tian Publisher: IOS Press ISBN: 1643681192 Category : Technology & Engineering Languages : en Pages : 314
Book Description
Electromagnetic Non-destructive Evaluation (ENDE) is an invaluable, non-invasive diagnostic tool for the inspection, testing, evaluation and characterization of materials and structures. It has now become indispensible in a number of diverse fields ranging from biomedics to many branches of industry and engineering. This book presents the proceedings of the 24th International Workshop on Electromagnetic Nondestructive Evaluation, held in Chengdu, China from 11 - 14 September 2019. The 38 peer-reviewed and extended contributions included here were selected from 45 original submissions, and are divided into 7 sections: eddy current testing and evaluation; advanced sensors; analytical and numerical modeling; material characterization; inverse problem and signal processing; artificial intelligence in ENDE; and industrial applications of ENDE. The papers cover recent studies concerning the progress and application of electromagnetic (EM) fields in the non-destructive examination of materials and structures, and topics covered include evaluations at a micro-structural level, such as correlating the magnetic properties of a material with its grain structure, and a macroscopic level, such as techniques and applications for EM NDT&E. Recent developments and emerging materials such as advanced EM sensors, multi-physics NDT&E, intelligent data management and maintaining the integrity of structures are also explored. The book provides a current overview of developments in ENDE, and will be of interest to all those working in the field.
Author: Ron S. Kenett Publisher: John Wiley & Sons ISBN: 1119271509 Category : Mathematics Languages : en Pages : 570
Book Description
A comprehensive treatment of systems and software testing using state of the art methods and tools This book provides valuable insights into state of the art software testing methods and explains, with examples, the statistical and analytic methods used in this field. Numerous examples are used to provide understanding in applying these methods to real-world problems. Leading authorities in applied statistics, computer science, and software engineering present state-of-the-art methods addressing challenges faced by practitioners and researchers involved in system and software testing. Methods include: machine learning, Bayesian methods, graphical models, experimental design, generalized regression, and reliability modeling. Analytic Methods in Systems and Software Testing presents its comprehensive collection of methods in four parts: Part I: Testing Concepts and Methods; Part II: Statistical Models; Part III: Testing Infrastructures; and Part IV: Testing Applications. It seeks to maintain a focus on analytic methods, while at the same time offering a contextual landscape of modern engineering, in order to introduce related statistical and probabilistic models used in this domain. This makes the book an incredibly useful tool, offering interesting insights on challenges in the field for researchers and practitioners alike. Compiles cutting-edge methods and examples of analytical approaches to systems and software testing from leading authorities in applied statistics, computer science, and software engineering Combines methods and examples focused on the analytic aspects of systems and software testing Covers logistic regression, machine learning, Bayesian methods, graphical models, experimental design, generalized regression, and reliability models Written by leading researchers and practitioners in the field, from diverse backgrounds including research, business, government, and consulting Stimulates research at the theoretical and practical level Analytic Methods in Systems and Software Testing is an excellent advanced reference directed toward industrial and academic readers whose work in systems and software development approaches or surpasses existing frontiers of testing and validation procedures. It will also be valuable to post-graduate students in computer science and mathematics.
Author: Giorgio Celant
Author: Giorgio Celant
Author: Giorgio Celant
Author: Giorgio Celant
Author: Giorgio Celant
Author: Celant
Author: G.Y. Tian
Author: Ron S. Kenett
Author: V.V. Fedorov
Author: Jack Kiefer