Author: Bahaa Saleh Publisher: Cambridge University Press ISBN: 1139495348 Category : Computers Languages : en Pages : 455
Book Description
Describing and evaluating the basic principles and methods of subsurface sensing and imaging, Introduction to Subsurface Imaging is a clear and comprehensive treatment that links theory to a wide range of real-world applications in medicine, biology, security and geophysical/environmental exploration. It integrates the different sensing techniques (acoustic, electric, electromagnetic, optical, x-ray or particle beams) by unifying the underlying physical and mathematical similarities, and computational and algorithmic methods. Time-domain, spectral and multisensor methods are also covered, whilst all the necessary mathematical, statistical and linear systems tools are given in useful appendices to make the book self-contained. Featuring a logical blend of theory and applications, a wealth of color illustrations, homework problems and numerous case studies, this is suitable for use as both a course text and as a professional reference.
Author: Bahaa E. A. Saleh Publisher: ISBN: 9781139078122 Category : Ground penetrating radar Languages : en Pages : 438
Book Description
Describes and evaluates the basic principles, methods and applications of subsurface sensing and imaging, covering a wide range of techniques.
Author: Bahaa Saleh Publisher: Cambridge University Press ISBN: 9781107000810 Category : Computers Languages : en Pages : 456
Book Description
Describing and evaluating the basic principles and methods of subsurface sensing and imaging, Introduction to Subsurface Imaging is a clear and comprehensive treatment that links theory to a wide range of real-world applications in medicine, biology, security and geophysical/environmental exploration. It integrates the different sensing techniques (acoustic, electric, electromagnetic, optical, x-ray or particle beams) by unifying the underlying physical and mathematical similarities, and computational and algorithmic methods. Time-domain, spectral and multisensor methods are also covered, whilst all the necessary mathematical, statistical and linear systems tools are given in useful appendices to make the book self-contained. Featuring a logical blend of theory and applications, a wealth of color illustrations, homework problems and numerous case studies, this is suitable for use as both a course text and as a professional reference.
Author: Öz Yilmaz Publisher: SEG Books ISBN: 1560803800 Category : Science Languages : en Pages : 1056
Book Description
Written for practicing geophysicists, “Land Seismic Case Studies for Near-Surface Modeling and Subsurface Imaging” is a comprehensive guide to understanding and interpreting seismic data. The culmination of land seismic data acquisition and processing projects conducted by the author over the last two decades, this book contains more than nearly 800 figures from worldwide case studies—conducted in both 2D and 3D. Beginning with Chapter 1 on seismic characterization of the near-surface, Chapter 2 presents near-surface modeling by traveltime and full-wave inversion, Chapter 3 presents near-surface modeling by imaging, and then Chapter 4 includes detailed case studies for near-surface modeling. Chapter 5 reviews single- and multichannel signal processing of land seismic data with the key objective of removing surface waves and guided waves that are characterized as coherent linear noise. Uncommon seismic data acquisition methods, including large-offset acquisition in thrust belts to capture the large-amplitude supercritical reflections, swath-line acquisition, and joint PP and SH- SH seismic imaging are highlighted in Chapter 6, and Chapter 7 presents image-based rms velocity estimation and discusses the problem of velocity uncertainty. The final two chapters focus exclusively on case studies: 2D in Chapter 8 and 3D in Chapter 9. An outstanding teaching tool, this book includes analysis workflows containing processing steps designed to solve specific problems. Essential for anyone involved in acquisition, processing, and inversion of seismic data, this volume will become the definitive reference for understanding how the variables in seismic acquisition are directly reflected in the data.
Author: Raffaele Persico Publisher: John Wiley & Sons ISBN: 1118835689 Category : Technology & Engineering Languages : en Pages : 392
Book Description
A real-world guide to practical applications of groundpenetrating radar (GPR) The nondestructive nature of ground penetrating radar makes itan important and popular method of subsurface imaging, but it is ahighly specialized field, requiring a deep understanding of theunderlying science for successful application. Introduction toGround Penetrating Radar: Inverse Scattering and DataProcessing provides experienced professionals with thebackground they need to ensure precise data collection andanalysis. Written to build upon the information presented in more generalintroductory volumes, the book discusses the fundamentalmathematical, physical, and engineering principles upon which GPRis built. Real-world examples and field data provide readers anaccurate view of day-to-day GPR use. Topics include: 2D scattering for dielectric and magnetic targets 3D scattering equations and migration algorithms Host medium characterization and diffraction tomography Time and frequency steps in GPR data sampling The Born approximation and the singular valuedecomposition The six appendices contain the mathematical proofs of allexamples discussed throughout the book. Introduction to GroundPenetrating Radar: Inverse Scattering and Data Processing is acomprehensive resource that will prove invaluable in the field.
Author: Jonathan C. Evenick Publisher: ISBN: 9781593704605 Category : Geological mapping Languages : en Pages : 0
Book Description
Subsurface mapping is a way to visualize and spatially characterize subsurface properties, and well logs are often the dataset used to generate and calibrate these maps. The correlation of basic geophysical logs rapidly enables oneself to begin to illustrate and understand the one-dimensional to 3D distribution of various properties. The second edition of Dr. Jonathan Evenick's book covers many types of basic well logs and subsurface maps. This book will help you quickly understand what many of these well logs are measuring and how they can be used to produce various subsurface maps. Three additional chapters and exercises have been included on spectral gamma ray logs, fault seal, geothermal energy, and source rock maps (unconventional resources). Features and Benefits Introduction to basic well logs and subsurface maps Applied exercises at that the end of each chapter Additional topics and materials have been included (i.e., spectral gamma ray logs, unconventional resources, geothermal maps, fault seal, paleogeographic maps, and resource uncertainty). Well log and subsurface mapping exercises for use in subsurface mapping, well logging, petroleum, hydrogeology, mining, and geothermal energy courses. *Full answer key available by request. Audience Geologists Geophysicists Petroleum and reservoir engineers Hydrogeologists Environmental consultants
Author: Daniel J. Tearpock Publisher: Pearson Education ISBN: 0132441683 Category : Technology & Engineering Languages : en Pages : 1414
Book Description
Applied Subsurface Geological Mapping, With Structural Methods, 2nd Edition is the practical, up-to-the-minute guide to the use of subsurface interpretation, mapping, and structural techniques in the search for oil and gas resources. Two of the industry's leading consultants present systematic coverage of the field's key principles and newest advances, offering guidance that is valuable for both exploration and development activities, as well as for "detailed" projects in maturely developed areas. Fully updated and expanded, this edition combines extensive information from the published literature with significant material never before published. The authors introduce superior techniques for every major petroleum-related tectonic setting in the world. Coverage includes: A systematic, ten-step philosophy for subsurface interpretation and mapping The latest computer-based contouring concepts and applications Advanced manual and computer-based log correlation Integration of geophysical data into subsurface interpretations and mapping Cross-section construction: structural, stratigraphic, and problem-solving Interpretation and generation of valid fault, structure, and isochore maps New coverage of 3D seismic interpretation, from project setup through documentation Compressional and extensional structures: balancing and interpretation In-depth new coverage of strike-slip faulting and related structures Growth and correlation consistency techniques: expansion indices, Multiple Bischke Plot Analysis, vertical separation versus depth, and more Numerous field examples from around the world Whatever your role in the adventure of finding and developing oil or gas resources–as a geologist, geophysicist, engineer, technologist, manager or investor–the tools presented in this book can make you significantly more effective in your daily technical or decision-oriented activities.
Author: Rebecca Bell Publisher: Elsevier ISBN: 0128196920 Category : Science Languages : en Pages : 384
Book Description
Interpreting Subsurface Seismic Data presents recent advances in methodologies for seismic imaging and interpretation across multiple applications in geophysics including exploration, marine geology, and hazards. It provides foundational information for context, as well as focussing on recent advances and future challenges. It offers detailed methodologies for interpreting the increasingly vast quantity of data extracted from seismic volumes. Organized into three parts covering foundational context, case studies, and future considerations, Interpreting Subsurface Seismic Data offers a holistic view of seismic data interpretation to ensure understanding while also applying cutting-edge technologies. This view makes the book valuable to researchers and students in a variety of geoscience disciplines, including geophysics, hydrocarbon exploration, applied geology, and hazards. Presents advanced seismic detection workflows utilized cutting-edge technologies Integrates geophysics and geology for a variety of applications, using detailed examples Provides an overview of recent advances in methodologies related to seismic imaging and interpretation
Author: G.M. Crean Publisher: Elsevier ISBN: 044459664X Category : Technology & Engineering Languages : en Pages : 413
Book Description
This volume focuses on a variety of novel non-destructive techniques for the characterization of materials, processes and devices. Emphasis is placed on probe-specimen interactions, in-situ diagnosis, instrumentation developments and future trends. This was the first time a symposium on this topic had been held, making the response particularly gratifying. The high quality of the contributions are a clear indication that non-destructive materials characterization is becoming a dynamic research area in Europe at the present time.A selection of contents: The role of acoustic properties in designs of acoustic and optical fibers (C.K. Jen). Observation of stable crack growth in Al2O3 ceramics using a scanning acoustic microscope (A. Quinten, W. Arnold). Mechanical characterization by acoustic techniques of SIC chemical vapour deposited thin films (J.M. Saurel et al.). Efficient generation of acoustic pressure waves by short laser pulses (S. Fassbender et al.). Use of scanning electron acoustic microscopy for the analysis of III-V compound devices (J.F. Bresse). Waves and vibrations in periodic piezoelectric composite materials (B.A. Auld). Precision ultrasonic velocity measurements for the study of the low temperature acoustic properties in defective materials (A. Vanelstraete, C. Laermans). Thermally induced concentration wave imaging (P. Korpiun et al.). Interferometric measurement of thermal expansion (V. Kurzmann et al.). Quantitative analyses of power loss mechanisms in semiconductor devices by thermal wave calorimetry (B. Büchner et al.). Thermal wave probing of the optical electronic and thermal properties of semiconductors (D. Fournier, A. Boccara). Thermal wave measurements in ion-implanted silicon (G. Queirola et al.). Optical-thermal non-destructive examination of surface coatings (R.E. Imhof et al.). Bonding analysis of layered materials by photothermal radiometry (M. Heuret et al.). Thermal non-linearities of semiconductor-doped glasses in the near-IR region (M. Bertolotti et al.). Theory of picosecond transient reflectance measurement of thermal and eisatic properties of thin metal films (Z. Bozóki et al.). The theory and application of contactless microwave lifetime measurement (T. Otaredian et al.). Ballistic phonon signal for imaging crystal properties (R.P. Huebener et al.). Determination of the elastic constants of a polymeric Langmuir-Blodgett film by Briliouin spectroscopy (F. Nizzoli et al.). Quantum interference effects in the optical second-harmonic response tensor of a metal surface (O. Keller). Study of bulk and surface phonons and plasmons in GaAs/A1As superlattices by far-IR and Raman spectroscopy (T. Dumslow et al.). Far-IR spectroscopy of bulk and surface phonon-polaritons on epitaxial layers of CdTe deposited by plasma MOCVD on GaAs substrates (T. Dumelow et al.). In-situ characterization by reflectance difference spectroscopy of III-V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition (O. Acher et al.). Optical evidence of precipitates in arsenic-implanted silicon (A. Borghesi et al.). Polarized IR reflectivity of CdGeAs2 (L. Artús et al.). Raman and IR spectroscopies: a useful combination to study semiconductor interfaces (D.R.T. Zahn et al.). Silicon implantation of GaAs at low and medium doses: Raman assessment of the dopant activation (S. Zakang et al.). Ellipsometric characterization of thin films and superlattices (J. Bremer et al.). Ellipsometric characterization of multilayer transistor structures (J.A. Woollam et al.). Quality of molecular-beam-epitaxy-grown GaAs on Si(100) studied by ellipsometry (U. Rossow et al.). An ellipsometric and RBS study of TiSi2 formation (J.M.M. de Nijs, A. van Silfhout). A new microscope for semiconductor luminescence studies (P.S. Aplin, J.C. Day). Structural analysis of optical fibre preforms fabricated by the sol-gel process (A.M. Elas et al.). Author index.
Author: Bahaa Saleh
Author: Bahaa E. A. Saleh
Author: Bahaa Saleh
Author: Öz Yilmaz
Author: Raffaele Persico
Author: Jonathan C. Evenick
Author: Daniel J. Tearpock
Author: Rebecca Bell
Author: Ben Kollock Sternberg
Author: G.M. Crean