Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis PDF full book. Access full book title Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin. Download full books in PDF and EPUB format.
Author: Patrick Echlin Publisher: Springer Science & Business Media ISBN: 0387857311 Category : Technology & Engineering Languages : en Pages : 329
Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author: Patrick Echlin Publisher: Springer Science & Business Media ISBN: 0387857311 Category : Technology & Engineering Languages : en Pages : 329
Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author: Patrick Echlin Publisher: Springer ISBN: 9781441946744 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author: Joseph Goldstein Publisher: Springer Science & Business Media ISBN: 1461332737 Category : Science Languages : en Pages : 679
Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: Peter W. Hawkes Publisher: Springer Nature ISBN: 3030000699 Category : Technology & Engineering Languages : en Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: Mamdouh El-Bakry Publisher: John Wiley & Sons ISBN: 1118964209 Category : Technology & Engineering Languages : en Pages : 400
Book Description
Provides the most recent developments in microscopy techniques and types of analysis used to study the microstructure of dairy products This comprehensive and timely text focuses on the microstructure analyses of dairy products as well as on detailed microstructural aspects of them. Featuring contributions from a global team of experts, it offers great insight into the understanding of different phenomena that relate to the functional and biochemical changes during processing and subsequent storage. Structured into two parts, Microstructure of Dairy Products begins with an overview of microscopy techniques and software used for microstructural analyses. It discusses, in detail, different types of the following techniques, such as: light microscopy (including bright field, polarized, and confocal scanning laser microscopy) and electron microscopy (mainly scanning and transmission electron microscopy). The description of these techniques also includes the staining procedures and sample preparation methods developed. Emerging microscopy techniques are also covered, reflecting the latest advances in this field. Part 2 of the book focuses on the microstructure of various dairy foods, dividing each into sections related to the microstructure of milk, cheeses, yogurts, powders, and fat products, ice cream and frozen dairy desserts, dairy powders and selected traditional Indian dairy products. In addition, there is a review of the localization of microorganism within the microstructure of various dairy products. The last chapter discusses the challenges and future trends of the microstructure of dairy products. Presents complete coverage of the latest developments in dairy product microscopy techniques Details the use of microscopy techniques in structural analysis An essential purchase for companies, researchers, and other professionals in the dairy sector Microstructure of Dairy Products is an excellent resource for food scientists, technologists, and chemists—and physicists, rheologists, and microscopists—who deal in dairy products.
Author: Chris Jacobsen Publisher: Cambridge University Press ISBN: 1107076579 Category : Medical Languages : en Pages : 594
Book Description
A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.
Author: Janusz Pawliszyn Publisher: Wiley-Blackwell ISBN: 9780813823621 Category : Science Languages : en Pages : 480
Book Description
Discover new keys to solving analytical problems using the Latest sample preparation methods Commonly viewed of as a routine task rather than as an integral component in the analytical process, sample preparation has long been undervalued as a science and underdeveloped as a technology. In an effort to reverse this trend, Handbook of Sample Preparation shows why sample preparation deserves closer scientific scrutiny, and makes a compelling case for colleges and professional laboratories to devote more resources to promote the benefits of its correct application. Handbook of Sample Preparation includes: A solid overview of standard sampling methodologies and their analytical capabilities An introduction of non-traditional sampling technologies, which address the need for solvent-free alternatives, automation, and miniaturization A discussion of the analytical shift toward performing sampling on-site, rather than in the laboratory An examination of various extraction technologies and their applications for different types of matrices A look at how to take advantage of new sampling strategies to streamline laboratory procedures, reduce research costs, and increase overall productivity An excellent primer on the fundamentals of extraction as well as a sound guide on the latest technological upgrades influencing current sampling techniques, this versatile text serves as an important and accessible tool for both students and seasoned practitioners as they seek new avenues for improving the accuracy of their analyses.
Author: Joseph Goldstein Publisher: Springer Science & Business Media ISBN: 1461502152 Category : Technology & Engineering Languages : en Pages : 689
Book Description
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Author: Anwar Ul-Hamid Publisher: Springer ISBN: 3319984829 Category : Technology & Engineering Languages : en Pages : 422
Book Description
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.
Author: Patrick Echlin
Author: Patrick Echlin
Author: Patrick Echlin
Author: Joseph Goldstein
Author: Graham Lawes
Author: Peter W. Hawkes
Author: Mamdouh El-Bakry
Author: Chris Jacobsen
Author: Janusz Pawliszyn
Author: Joseph Goldstein
Author: Anwar Ul-Hamid