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Author: Stanley L. Flegler Publisher: ISBN: 9780195107517 Category : Medical Languages : en Pages : 240
Book Description
This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.
Author: Stanley L. Flegler Publisher: ISBN: 9780195107517 Category : Medical Languages : en Pages : 240
Book Description
This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide you through microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique book covers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmission electron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.
Author: Stephen J. Pennycook Publisher: Springer Science & Business Media ISBN: 1441972005 Category : Technology & Engineering Languages : en Pages : 762
Book Description
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author: Dr Robert Keyse Publisher: Routledge ISBN: 1351436619 Category : Technology & Engineering Languages : en Pages : 127
Book Description
1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Author: Robert Keyse Publisher: CRC Press ISBN: 9781138441514 Category : Languages : en Pages :
Book Description
STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Author: Robert J. Keyse Publisher: ISBN: 9780203749890 Category : SCIENCE Languages : en Pages :
Book Description
Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM.
Author: Robert J. Keyse Publisher: Springer ISBN: 9789813083431 Category : Languages : en Pages : 114
Book Description
STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
Author: Ray Egerton Publisher: Springer Science & Business Media ISBN: 9780387258003 Category : Technology & Engineering Languages : en Pages : 224
Book Description
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author: Rolf Erni Publisher: World Scientific ISBN: 1848165366 Category : Science Languages : en Pages : 348
Book Description
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction. The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.
Author: Stanley L. Flegler
Author: Stanley L. Flegler
Author: Stephen J. Pennycook
Author: Dr Robert Keyse
Author: Robert Keyse
Author: Robert J. Keyse
Author: Robert J. Keyse
Author: Ray Egerton
Author: Stanley L. Flegler
Author: Rolf Erni
Author: Marc De Graef