Author: R. Barer
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 444

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Book Description

Author: Tom Mulvey
Publisher: Academic Press
ISBN: 9780120299119
Category : Science
Languages : en
Pages : 206

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Book Description
Volumes in this series cover progress and innovation in optical and electron microscopy at a fundamental level aimed at microscopists, and researchers interested in microscope instrumentation and applications rangingfrom biological techniques to materials research and industrial inspection.Key Features* Covers recent advances in microscopical techniques* Applicable to researchers in microscope instrumentation and to users in a range of disciplines, including biology, materials research and development, non-destructive testing, and the electronics service industry

Author: R. Barer
Publisher:
ISBN: 9780120299096
Category : Electron microscopy
Languages : en
Pages : 370

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Book Description

Author:
Publisher: Academic Press
ISBN: 9780080961583
Category : Technology & Engineering
Languages : en
Pages : 320

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Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians

Author: J.K. Koehler
Publisher: Springer Science & Business Media
ISBN: 3642654924
Category : Science
Languages : en
Pages : 319

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Book Description
The past decade has seen a remarkable increase in the use of electron microscopy as a researm tool in biology and medicine. Thus, most institu tions of higher learning now boast several electron optical laboratories having various levels of sophistication. Training in the routine use of elec tron optical equipment and interpretation of results is no longer restricted to a few prestigious centers. On the other hand, temniques utilized by researm workers in the ultrastructural domain have become extremely diverse and complex. Although a large number of quite excellent volumes of electron microscopic temnique are now dedicated to the basic elements available whim allow the novice to acquire a reasonable introduction to the field, relatively few books have been devoted to a discussion of more ad vanced temnical aspects of the art. It was with this view that the present volume was conceived as a handy reference for workers already having some background in the field, as an information source for those wishing to shift efforts into more promising temniques, or for use as an advanced course or seminar guide. Subject matter has been mosen particularly on the basis of pertinence to present researm activities in biological electron microscopy and emphasis has been given those areas whim seem destined to greatly expand in useful ness in the near future.

Author:
Publisher: Academic Press
ISBN: 9780080880358
Category : Technology & Engineering
Languages : en
Pages : 590

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Book Description
The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth. * First book on the subject of correctors * Well known contributors from academia and microscope manufacturers * Provides an ideal starting point for preparing funding proposals

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128052287
Category : Computers
Languages : en
Pages : 277

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Book Description
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates with all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Author: V. E. Cosslett
Publisher: Academic Press
ISBN: 9780120299010
Category :
Languages : en
Pages :

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Book Description

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080525474
Category : Technology & Engineering
Languages : en
Pages : 481

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Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Author:
Publisher: Academic Press
ISBN: 0128025190
Category : Computers
Languages : en
Pages : 342

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Book Description
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing