Selected Papers on Optical Techniques for Industrial Inspection PDF Download

Author: Paolo G. Cielo
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Engineering inspection
Languages : en
Pages : 746

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Book Description
Contents of this volume include: on-line glossmeter for stainless steel sheets; in process optical measurement of micro profile on cold rolled steel plates; optical profile transducer; and optical profilers for surface roughness.

Author: Paolo G. Cielo
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 632

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Book Description
This book presents an extensive review of the optical- and laser-based techniques that are available for quality control and process monitoring in the industrial production environment. The physical principles of each technique are explained in simple terms, and their applicability to specific industrial needs is discussed on the basis of wide hands-on experience. A large number of practical applications to in-process industrial sensing and metrology are described, and more than onethousand references are included. Topics include on-line surface inspection, 3-D imaging, nondestructive testing, fiber-optic sensors, robot guidance, as well as spectroscopic and light-scattering process analyzers. Key Features * Describes a large number of practical applications to in-process industrial sensing and metrology * Includes more than one thousand references * Covers on-line surface inspection, 3-D imaging, nondestructive testing, fiber-optic sensors, robot guidance, and more

Author: Zheng Liu
Publisher: Springer
ISBN: 1447167414
Category : Computers
Languages : en
Pages : 541

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Book Description
This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications. Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.

Author:
Publisher: Academic Press
ISBN: 0123785650
Category : Science
Languages : en
Pages : 480

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Book Description
This book describes the practice of radiation thermometry, both at a primary level and for a variety of applications, such as in the materials processing industries and remote sensing. This book is written for those who will a) apply radiation thermometry in industrial practice b) use radiation thermometers for scientific research, c) the radiation thermometry specialist in a national measurement institute d) developers of radiation thermometers who are working to innovate products for instrument manufacturers and e) developers non-contact thermometry methods to address challenging thermometry problems. The author(s) of each chapter were chosen from a group of international scientists who are experts in the field and specialist(s) on the subject matter covered in the chapter. A large number of references are included at the end of each chapter as a resource for those seeking a deeper or more detailed understanding. This book is more than a practice guide. Readers will gain in-depth knowledge in: (1) the proper selection of the type of thermometer; (2) the best practice in using the radiation thermometers; (3) awareness of the error sources and subsequent appropriate procedure to reduce the overall uncertainty; and (4) understanding of the calibration chain and its current limitations. Coverage of all fundamental aspects of the radiometric measurements Coverage of practical applications with details on the instrumentation, calibration, and error sources Authors are from the national labs internationally leading in R&D in temperature measurements Comprehensive coverage with large number of references

Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1420019163
Category : Science
Languages : en
Pages : 524

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Book Description
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.

Author: Bruce G. Batchelor
Publisher:
ISBN:
Category : Computer vision
Languages : en
Pages : 668

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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

Author: Francis T. S. Yu
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Optical pattern recognition
Languages : en
Pages : 668

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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

Author: Olaf Minet
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Optical tomography
Languages : en
Pages : 746

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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

Author: Victor M. Bright
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Microelectromechanical systems
Languages : en
Pages : 654

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Book Description
A selection of 81 papers on six major topics within the field of optical microelectromechanical systems (MEMS).

Author: Jeffrey H. Hunt
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Nonlinear optical spectroscopy
Languages : en
Pages : 708

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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.