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Author: Prabhat Mishra Publisher: Springer ISBN: 3319981161 Category : Technology & Engineering Languages : en Pages : 394
Book Description
This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.
Author: Prabhat Mishra Publisher: Springer ISBN: 3319981161 Category : Technology & Engineering Languages : en Pages : 394
Book Description
This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.
Author: Xiao Liu Publisher: Springer Science & Business Media ISBN: 3319005332 Category : Technology & Engineering Languages : en Pages : 108
Book Description
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Author: Mehdi Dehbashi Publisher: Springer ISBN: 3319093096 Category : Technology & Engineering Languages : en Pages : 171
Book Description
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
Author: Bart Vermeulen Publisher: Springer ISBN: 3319062425 Category : Technology & Engineering Languages : en Pages : 311
Book Description
This book describes an approach and supporting infrastructure to facilitate debugging the silicon implementation of a System-on-Chip (SOC), allowing its associated product to be introduced into the market more quickly. Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors. The authors’ novel communication-centric, scan-based, abstraction-based, run/stop-based (CSAR) debug approach is discussed in detail, showing how it helps to meet debug requirements and address the nine, previously identified factors that complicate debugging silicon implementations of SOCs. The authors also derive the debug infrastructure requirements to support debugging of a silicon implementation of an SOC with their CSAR debug approach. This debug infrastructure consists of a generic on-chip debug architecture, a configurable automated design-for-debug flow to be used during the design of an SOC, and customizable off-chip debugger software. Coverage includes an evaluation of the efficiency and effectiveness of the CSAR approach and its supporting infrastructure, using six industrial SOCs and an illustrative, example SOC model. The authors also quantify the hardware cost and design effort to support their approach.
Author: Rupak Majumdar Publisher: Springer ISBN: 3319633902 Category : Computers Languages : en Pages : 623
Book Description
The two-volume set LNCS 10426 and LNCS 10427 constitutes the refereed proceedings of the 29th International Conference on Computer Aided Verification, CAV 2017, held in Heidelberg, Germany, in July 2017. The total of 50 full and 7 short papers presented together with 5 keynotes and tutorials in the proceedings was carefully reviewed and selected from 191 submissions. The CAV conference series is dedicated to the advancement of the theory and practice of computer-aided formal analysis of hardware and software systems. The conference covers the spectrum from theoretical results to concrete applications, with an emphasis on practical verification tools and the algorithms and techniques that are needed for their implementation.
Author: Ilya Wagner Publisher: Springer Science & Business Media ISBN: 1441980342 Category : Technology & Engineering Languages : en Pages : 224
Book Description
The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. The authors start by giving an overview of the state of the art in verification, particularly current post-silicon methodologies in use in the industry, both for the domain of processor pipeline design and for memory subsystems. They then dive into the presentation of several new post-silicon verification solutions aimed at boosting the verification coverage of modern processors, dedicating several chapters to this topic. The presentation of runtime verification solutions follows a similar approach. This is an area of processor design that is still in its early stages of exploration and that holds the promise of accomplishing the ultimate goal of achieving complete correctness guarantees for microprocessor-based computation. The authors conclude the book with a look towards the future of late-stage verification and its growing role in the processor life-cycle.
Author: Ofer Strichman Publisher: Springer ISBN: 3319703897 Category : Computers Languages : en Pages : 268
Book Description
This book constitutes the refereed proceedings of the 13th International Haifa Verification Conference, HVC 2017, held in Haifa, Israel in November 2017.The 13 revised full papers presented together with 4 poster and 5 tool demo papers were carefully reviewed and selected from 45 submissions. They are dedicated to advance the state of the art and state of the practice in verification and testing and are discussing future directions of testing and verification for hardware, software, and complex hybrid systems.
Author: Swarup Bhunia Publisher: Springer ISBN: 3319500570 Category : Technology & Engineering Languages : en Pages : 316
Book Description
This book is about security in embedded systems and it provides an authoritative reference to all aspects of security in system-on-chip (SoC) designs. The authors discuss issues ranging from security requirements in SoC designs, definition of architectures and design choices to enforce and validate security policies, and trade-offs and conflicts involving security, functionality, and debug requirements. Coverage also includes case studies from the “trenches” of current industrial practice in design, implementation, and validation of security-critical embedded systems. Provides an authoritative reference and summary of the current state-of-the-art in security for embedded systems, hardware IPs and SoC designs; Takes a "cross-cutting" view of security that interacts with different design and validation components such as architecture, implementation, verification, and debug, each enforcing unique trade-offs; Includes high-level overview, detailed analysis on implementation, and relevant case studies on design/verification/debug issues related to IP/SoC security.
Author: Prabhat Mishra Publisher: Springer Nature ISBN: 3030691314 Category : Technology & Engineering Languages : en Pages : 496
Book Description
This book provides comprehensive coverage of Network-on-Chip (NoC) security vulnerabilities and state-of-the-art countermeasures, with contributions from System-on-Chip (SoC) designers, academic researchers and hardware security experts. Readers will gain a clear understanding of the existing security solutions for on-chip communication architectures and how they can be utilized effectively to design secure and trustworthy systems.
Author: Prabhat Mishra
Author: Prabhat Mishra
Author: Xiao Liu
Author: Mehdi Dehbashi
Author: Bart Vermeulen
Author: Sneh Saurabh
Author: Rupak Majumdar
Author: Ilya Wagner
Author: Ofer Strichman
Author: Swarup Bhunia
Author: Prabhat Mishra