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Author: Xiao Liu Publisher: Springer Science & Business Media ISBN: 3319005332 Category : Technology & Engineering Languages : en Pages : 108
Book Description
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Author: Xiao Liu Publisher: Springer Science & Business Media ISBN: 3319005332 Category : Technology & Engineering Languages : en Pages : 108
Book Description
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
Author: Prabhat Mishra Publisher: Springer ISBN: 3319981161 Category : Technology & Engineering Languages : en Pages : 394
Book Description
This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.
Author: Prabhat Mishra Publisher: Springer Nature ISBN: 3030691314 Category : Technology & Engineering Languages : en Pages : 496
Book Description
This book provides comprehensive coverage of Network-on-Chip (NoC) security vulnerabilities and state-of-the-art countermeasures, with contributions from System-on-Chip (SoC) designers, academic researchers and hardware security experts. Readers will gain a clear understanding of the existing security solutions for on-chip communication architectures and how they can be utilized effectively to design secure and trustworthy systems.
Author: Brajesh Kumar Kaushik Publisher: Springer ISBN: 9811074704 Category : Computers Languages : en Pages : 815
Book Description
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Author: Erik Seligman Publisher: Morgan Kaufmann ISBN: 0128008156 Category : Computers Languages : en Pages : 408
Book Description
Formal Verification: An Essential Toolkit for Modern VLSI Design presents practical approaches for design and validation, with hands-on advice to help working engineers integrate these techniques into their work. Formal Verification (FV) enables a designer to directly analyze and mathematically explore the quality or other aspects of a Register Transfer Level (RTL) design without using simulations. This can reduce time spent validating designs and more quickly reach a final design for manufacturing. Building on a basic knowledge of SystemVerilog, this book demystifies FV and presents the practical applications that are bringing it into mainstream design and validation processes at Intel and other companies. After reading this book, readers will be prepared to introduce FV in their organization and effectively deploy FV techniques to increase design and validation productivity. Learn formal verification algorithms to gain full coverage without exhaustive simulation Understand formal verification tools and how they differ from simulation tools Create instant test benches to gain insight into how models work and find initial bugs Learn from Intel insiders sharing their hard-won knowledge and solutions to complex design problems
Author: Masahiro Fujita Publisher: Springer ISBN: 9781461409311 Category : Technology & Engineering Languages : en Pages : 300
Book Description
This book describes techniques for how to verify and debug VLSI designs when bugs are found after the chips are fabricated and used in the field. This is the first book to cover many aspects of post-silicon verification and debugging techniques that utilize high-level design information, such as design descriptions in C/C++. Using high-level analysis on the error traces generated by fabricated chips maximizes the efficiency of the verification and debugging techniques presented in this book. Experimental results are included for real applications of the techniques presented.
Author: Madhusudan Parthasarathy Publisher: Springer ISBN: 3642314244 Category : Computers Languages : en Pages : 789
Book Description
This book constitutes the refereed proceedings of the 24th International Conference on Computer Aided Verification, CAV 2012, held in Berkeley, CA, USA in July 2012. The 38 regular and 20 tool papers presented were carefully reviewed and selected from 185 submissions. The papers are organized in topical sections on automata and synthesis, inductive inference and termination, abstraction, concurrency and software verification, biology and probabilistic systems, embedded and control systems, SAT/SMT solving and SMT-based verification, timed and hybrid systems, hardware verification, security, verification and synthesis, and tool demonstration.
Author: Bart Vermeulen Publisher: Springer ISBN: 3319062425 Category : Technology & Engineering Languages : en Pages : 311
Book Description
This book describes an approach and supporting infrastructure to facilitate debugging the silicon implementation of a System-on-Chip (SOC), allowing its associated product to be introduced into the market more quickly. Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors. The authors’ novel communication-centric, scan-based, abstraction-based, run/stop-based (CSAR) debug approach is discussed in detail, showing how it helps to meet debug requirements and address the nine, previously identified factors that complicate debugging silicon implementations of SOCs. The authors also derive the debug infrastructure requirements to support debugging of a silicon implementation of an SOC with their CSAR debug approach. This debug infrastructure consists of a generic on-chip debug architecture, a configurable automated design-for-debug flow to be used during the design of an SOC, and customizable off-chip debugger software. Coverage includes an evaluation of the efficiency and effectiveness of the CSAR approach and its supporting infrastructure, using six industrial SOCs and an illustrative, example SOC model. The authors also quantify the hardware cost and design effort to support their approach.
Author: Xiao Liu
Author: Xiao Liu
Author: Prabhat Mishra
Author: Prabhat Mishra
Author: Brajesh Kumar Kaushik
Author: Sneh Saurabh
Author: 
Author: Erik Seligman
Author: Masahiro Fujita
Author: Madhusudan Parthasarathy
Author: Bart Vermeulen