Scanning Probe Microscopy of Functional Materials PDF Download

Author: Sergei V. Kalinin
Publisher: Springer Science & Business Media
ISBN: 144197167X
Category : Technology & Engineering
Languages : en
Pages : 563

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Book Description
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Author: Paula M. Vilarinho
Publisher: Springer Science & Business Media
ISBN: 1402030193
Category : Science
Languages : en
Pages : 503

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Book Description
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Author: Sergei V Kalinin
Publisher: Springer
ISBN: 9781493939473
Category :
Languages : en
Pages : 576

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Book Description
Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Author: Sergei V. Kalinin
Publisher: Springer
ISBN: 9781441965677
Category : Technology & Engineering
Languages : en
Pages : 555

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Book Description
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Author: Sergei V. Kalinin
Publisher: Springer Science & Business Media
ISBN: 0387286683
Category : Technology & Engineering
Languages : en
Pages : 1002

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Book Description
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Author: Adam Foster
Publisher: Springer Science & Business Media
ISBN: 0387372318
Category : Technology & Engineering
Languages : en
Pages : 292

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Book Description
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Author: Vladimir V. Tsukruk
Publisher: John Wiley & Sons
ISBN: 3527639969
Category : Technology & Engineering
Languages : en
Pages : 663

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Book Description
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors

Author: Bert Voigtländer
Publisher: Springer
ISBN: 3662452405
Category : Technology & Engineering
Languages : en
Pages : 382

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Book Description
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Author: David G. Rickerby
Publisher: Springer Science & Business Media
ISBN: 9401144516
Category : Technology & Engineering
Languages : en
Pages : 503

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Book Description
The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Author: T. Sakurai
Publisher: Springer Science & Business Media
ISBN: 3642569498
Category : Technology & Engineering
Languages : en
Pages : 352

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Book Description
There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.