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Author: Paula M. Vilarinho Publisher: Springer Science & Business Media ISBN: 1402030193 Category : Science Languages : en Pages : 503
Book Description
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Author: Paula M. Vilarinho Publisher: Springer Science & Business Media ISBN: 1402030193 Category : Science Languages : en Pages : 503
Book Description
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Author: Sergei V. Kalinin Publisher: Springer Science & Business Media ISBN: 144197167X Category : Technology & Engineering Languages : en Pages : 563
Book Description
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Author: Sergei V Kalinin Publisher: Springer ISBN: 9781493939473 Category : Languages : en Pages : 576
Book Description
Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Author: Sergei V. Kalinin Publisher: Springer ISBN: 9781441965677 Category : Technology & Engineering Languages : en Pages : 555
Book Description
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Author: Sergei V. Kalinin Publisher: Springer Science & Business Media ISBN: 0387286683 Category : Technology & Engineering Languages : en Pages : 1002
Book Description
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Author: Bharat Bhushan Publisher: Springer Science & Business Media ISBN: 3642104975 Category : Technology & Engineering Languages : en Pages : 816
Book Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Ampere A. Tseng Publisher: World Scientific ISBN: 9812790896 Category : Technology & Engineering Languages : en Pages : 583
Book Description
Many of the devices and systems used in modern industry are becoming progressively smaller and have reached the nanoscale domain. Nanofabrication aims at building nanoscale structures, which can act as components, devices, or systems, in large quantities at potentially low cost. Nanofabrication is vital to all nanotechnology fields, especially for the realization of nanotechnology that involves the traditional areas across engineering and science. This is the first book solely dedicated to the manufacturing technology in nanoscale structures, devices, and systems and is designed to satisfy the growing demands of researchers, professionals, and graduate students. Both conventional and non-conventional fabrication technologies are introduced with emphasis on multidisciplinary principles, methodologies, and practical applications. While conventional technologies consider the emerging techniques developed for next generation lithography, non-conventional techniques include scanning probe microscopy lithography, self-assembly, and imprint lithography, as well as techniques specifically developed for making carbon tubes and molecular circuits and devices. Sample Chapter(s). Chapter 1: Atom, Molecule, and Nanocluster Manipulations for Nanostructure Fabrication Using Scanning Probe Microscopy (3,320 KB). Contents: Atomic Force Microscope Lithography (N Kawasegi et al.); Nanowire Assembly and Integration (Z Gu & D H Gracias); Extreme Ultraviolet Lithography (H Kinoshita); Electron Projection Lithography (T Miura et al.); Electron Beam Direct Writing (K Yamazaki); Electron Beam Induced Deposition (K Mitsuishi); Focused Ion Beams and Interaction with Solids (T Ishitani et al.); Nanofabrication of Nanoelectromechanical Systems (NEMS): Emerging Techniques (K L Ekinci & J Brugger); and other papers. Readership: Researchers, professionals, and graduate students in the fields of nanoengineering and nanoscience.
Author: Dawn A Bonnell Publisher: World Scientific ISBN: 9814434728 Category : Science Languages : en Pages : 640
Book Description
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field. Contents:Introduction:Local Probes in the Next Decade of Energy Research: Bridging Macroscopic and Atomic Worlds (D A Bonnell and S V Kalinin)Scanning Probes for Energy Harvesting Systems: Photovoltaics and Solar Cells:Electrical Scanning Probe Microscopy on Solar Cell Materials (R Giridharagopal, G E Rayermann and D S Ginger)Organic Solar Cell Materials and Devices Characterized by Conductive and Photoconductive Atomic Force Microscopy (X-D Dang, M Guide and T-Q Nguyen)Kelvin Probe Force Microscopy for Solar Cell Applications (T Glatzel)Reversible Rectification in Sub-Monolayer Molecular P-N Junctions: Towards Nanoscale Photovoltaic Studies (J A Smerdon, N C Giebink and J R Guest)Study of Photoinduced Charges with Atomic Force Microscopy (M Dokukin, N Guz and I Sokolov)Imaging of Nanoscale Photogenerated Charge Transport in Organic Photovoltaic Materials (B Hamadani, P M Haney and N B Zhitenev)Photoassisted Kelvin Probe Force Microscopy for Characterization of Solar Cell Materials (T Takahashi)Scanning Probes for Fuel Cells and Local Electrochemistry:Electrochemical Strain Microscopy of Oxygen-Ion Conductors: Fuel Cells and Oxide Electronics (A Kumar, S Jesse, S V Kalinin, F Ciucci and A Morozovska)Ion Dynamics in Nanoscopic Subvolumes of Solid Electrolytes Analysed by Electrostatic Force Spectroscopy (A Schirmeisen and B Roling)Nanoscale Electrochemistry in Energy Related Systems Using Atomic Force Microscopy (W Lee, M H Lee, R P O'Hayre and F B Prinz)Scanning Probe Microscopy of Fuel Cell Materials Under Realistic Operating Conditions (S S Nonnenmann and D A Bonnell)Scanning Probe Microscopy of Energy Storage Materials and Devices:In situ SPM Analysis of Interfacial Phenomena in Lithium-Ion Batteries (M Inaba, S-K Jeong and Z Ogumi)Conducting-Probe Atomic Force Microscopy of Electrochemical Interfaces (P A Veneman and K J Stevenson)Electrochemical Strain Microscopy of Li-ion and Li-air Battery Materials (T M Arruda, N Balke, S Jesse and S V Kalinin)Emerging Scanning Probe Techniques:High Sensitivity Scanning Impedance Microscopy and Spectroscopy (S S Nonnenmann, X Chen and D A Bonnell)Scanning Microwave Microscopy: Advances in Quantitative Capacitance and Carrier Density Measurements at the Nanometer Scale (S Wu, F Kienberger and H Tanbakuchi)Mapping Electrochemistry at the Micro and Nanoscales with Scanning Ion Conductance Microscopy (C Laslau, D E Williams and J Travas-Sejdic)Force Microscopy, Nanochemistry and Nanofabrication (R Garcia, M Chiesa and Y K Ryu)Studying the Mechanism of Piezoelectric Nanogenerators (J Song and Z L Wang) Readership: Students, professionals and researchers in materials science, nanomaterials and new materials. Keywords:Energy Materials;Scanning Probe Microscopy;Fuel Cells;Photovoltaics;Batteries;Solar CellsKey Features:A first broad overview of SPM for energy materials and devicesWritten by world leaders in scanning probe microscopyContains both applications of established SPM techniques as well as overview of novel emergent methods and addresses applications in all major arenas of energy: alternative energy generation, energy harvesting, and storage
Author: Bharat Bhushan Publisher: Springer Science & Business Media ISBN: 3642254136 Category : Science Languages : en Pages : 634
Book Description
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Author: Sascha Sadewasser Publisher: Springer ISBN: 3319756877 Category : Science Languages : en Pages : 521
Book Description
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Author: Paula M. Vilarinho
Author: Paula M. Vilarinho
Author: Sergei V. Kalinin
Author: Sergei V Kalinin
Author: Sergei V. Kalinin
Author: Sergei V. Kalinin
Author: Bharat Bhushan
Author: Ampere A. Tseng
Author: Dawn A Bonnell
Author: Bharat Bhushan
Author: Sascha Sadewasser