Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author: National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Author: Monthly Catalog of United States Government Publications
Author: Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1328
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 146
Book Description
Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )
Author: Barry N. TaylorPublisher: DIANE Publishing
ISBN: 1437915566
Category : Science
Languages : en
Pages : 25
Book Description
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Responding to National Needs
Author: James F. SchooleyFirst Text Retrieval Conference (TREC-1)
Author: D. K. HarmanPublisher: DIANE Publishing
ISBN: 0788125214
Category :
Languages : en
Pages : 527
Book Description
Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.
Guide for the Use of the International System of Units (SI)
Author: Barry TaylorPublisher: DIANE Publishing
ISBN: 0788125796
Category : Metric system
Languages : en
Pages : 84
Book Description
A basic introduction to the metric system. Covers: the three classes of SI units & the SI prefixes; units outside the SI; rules & style conventions for printing & using units; rules & style conventions for expressing values of quantities; comments on some quantities & their units; rules & style conventions for spelling unit names; printing & using symbols & numbers in scientific & technical documents; & check list for reviewing manuscripts. Appendix: definitions of SI base units & the radian & Steradian; conversion factors, & comments on the references of the SI for the U.S. Extensive bibliography.