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Author: Alexander Miczo Publisher: John Wiley & Sons ISBN: 0471457779 Category : Technology & Engineering Languages : en Pages : 697
Book Description
Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Author: Alexander Miczo Publisher: John Wiley & Sons ISBN: 0471457779 Category : Technology & Engineering Languages : en Pages : 697
Book Description
Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Author: Alexander Miczo Publisher: Wiley ISBN: 9780471604228 Category : Languages : en Pages : 480
Book Description
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
Author: Hideo Fujiwara Publisher: MIT Press (MA) ISBN: 9780262561990 Category : Business & Economics Languages : en Pages : 298
Book Description
Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.
Author: Brian Holdsworth Publisher: Elsevier ISBN: 0080477305 Category : Technology & Engineering Languages : en Pages : 519
Book Description
New, updated and expanded topics in the fourth edition include: EBCDIC, Grey code, practical applications of flip-flops, linear and shaft encoders, memory elements and FPGAs. The section on fault-finding has been expanded. A new chapter is dedicated to the interface between digital components and analog voltages. *A highly accessible, comprehensive and fully up to date digital systems text *A well known and respected text now revamped for current courses *Part of the Newnes suite of texts for HND/1st year modules
Author: Parag K. Lala Publisher: Springer Nature ISBN: 303179785X Category : Technology & Engineering Languages : en Pages : 99
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Miron Abramovici Publisher: Wiley-IEEE Press ISBN: 9780780310629 Category : Technology & Engineering Languages : en Pages : 672
Book Description
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Author: N. K. Jha Publisher: Cambridge University Press ISBN: 9781139437431 Category : Computers Languages : en Pages : 1022
Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Parag K. Lala Publisher: ISBN: Category : Computers Languages : en Pages : 440
Book Description
This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.
Author: Frank Vahid Publisher: John Wiley & Sons ISBN: Category : Computers Languages : en Pages : 558
Book Description
"Digital Design provides a modern approach to learning the increasingly important topic of digital systems design. The text's focus on register-transfer-level design and present-day applications not only leads to a better appreciation of computers and of today's ubiquitous digital devices, but also provides for a better understanding of careers involving digital design and embedded system design. The book's key features include: An emphasis on register-transfer-level (RTL) design, the level at which most digital design is practiced today, giving readers a modern perspective of the field's applicability. Yet, coverage stays bottom-up and concrete, starting from basic transistors and gates, and moving step-by-step up to more complex components. Extensive use of basic examples to teach and illustrate new concepts, and of application examples, such as pacemakers, ultrasound machines, automobiles, and cell phones, to demonstrate the immediate relevance of the concepts. Separation of basic design from optimization, allowing development of a solid understanding of basic design, before considering the more advanced topic of optimization. Flexible organization, enabling early or late coverage of optimization methods or of HDLs, and enabling choice of VHDL, Verilog, or SystemC HDLs. Career insights and advice from designers with varying levels of experience. A clear bottom-up description of field-programmable gate arrays (FPGAs). About the Author: Frank Vahid is a Professor of Computer Science & Engineering at the University of California, Riverside. He holds Electrical Engineering and Computer Science degrees; has worked/consulted for Hewlett Packard, AMCC, NEC, Motorola, and medical equipment makers; holds 3 U.S. patents; has received several teaching awards; helped setup UCR's Computer Engineering program; has authored two previous textbooks; and has published over 120 papers on digital design topics (automation, architecture, and low-power).
Author: Alexander Miczo
Author: Alexander Miczo
Author: Alexander Miczo
Author: Alexander Miczo
Author: Hideo Fujiwara
Author: Brian Holdsworth
Author: Parag K. Lala
Author: Miron Abramovici
Author: N. K. Jha
Author: Parag K. Lala
Author: Frank Vahid