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Author: Fangming Ye Publisher: Springer ISBN: 3319402102 Category : Technology & Engineering Languages : en Pages : 147
Book Description
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.
Author: Fangming Ye Publisher: Springer ISBN: 3319402102 Category : Technology & Engineering Languages : en Pages : 147
Book Description
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.
Author: Jingzheng Ren Publisher: Elsevier ISBN: 012821743X Category : Technology & Engineering Languages : en Pages : 542
Book Description
Applications of Artificial Intelligence in Process Systems Engineering offers a broad perspective on the issues related to artificial intelligence technologies and their applications in chemical and process engineering. The book comprehensively introduces the methodology and applications of AI technologies in process systems engineering, making it an indispensable reference for researchers and students. As chemical processes and systems are usually non-linear and complex, thus making it challenging to apply AI methods and technologies, this book is an ideal resource on emerging areas such as cloud computing, big data, the industrial Internet of Things and deep learning. With process systems engineering's potential to become one of the driving forces for the development of AI technologies, this book covers all the right bases. Explains the concept of machine learning, deep learning and state-of-the-art intelligent algorithms Discusses AI-based applications in process modeling and simulation, process integration and optimization, process control, and fault detection and diagnosis Gives direction to future development trends of AI technologies in chemical and process engineering
Author: Michael G. Pecht Publisher: John Wiley & Sons ISBN: 1119515351 Category : Technology & Engineering Languages : en Pages : 800
Book Description
An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.
Author: Patrick Girard Publisher: Springer Nature ISBN: 3031196392 Category : Technology & Engineering Languages : en Pages : 320
Book Description
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Author: Qing Duan Publisher: Springer ISBN: 3319187384 Category : Technology & Engineering Languages : en Pages : 160
Book Description
This book provides a comprehensive set of optimization and prediction techniques for an enterprise information system. Readers with a background in operations research, system engineering, statistics, or data analytics can use this book as a reference to derive insight from data and use this knowledge as guidance for production management. The authors identify the key challenges in enterprise information management and present results that have emerged from leading-edge research in this domain. Coverage includes topics ranging from task scheduling and resource allocation, to workflow optimization, process time and status prediction, order admission policies optimization, and enterprise service-level performance analysis and prediction. With its emphasis on the above topics, this book provides an in-depth look at enterprise information management solutions that are needed for greater automation and reconfigurability-based fault tolerance, as well as to obtain data-driven recommendations for effective decision-making.
Author: Yingmin Jia Publisher: Springer ISBN: 9811064997 Category : Technology & Engineering Languages : en Pages : 787
Book Description
This book presents selected research papers from CISC’17, held in MudanJiang, China. The topics covered include Multi-agent system, Evolutionary Computation, Artificial Intelligence, Complex systems, Computation intelligence and soft computing, Intelligent control, Advanced control technology, Robotics and applications, Intelligent information processing, Iterative learning control, Machine Learning, and etc. Engineers and researchers from academia, industry, and government can gain valuable insights into solutions combining ideas from multiple disciplines in the field of intelligent systems.
Author: S. Ramani Publisher: Springer Science & Business Media ISBN: 9783540528500 Category : Computers Languages : en Pages : 564
Book Description
This volume presents selected papers from KBCS '89, which is the second in a series of annual conferences hosted by the Knowledge Based Computer Systems Project funded by the Government of India with United Nations assistance. The papers are grouped into sections including: - AI applications - computer architecture and parallel processing - expert systems - intelligent tutoring systems - knowledge representation - logic programming - natural language understanding - pattern recognition - reasoning - search - activities at the KBCS Nodal Centres.
Author: Shi Jin Publisher: Springer Nature ISBN: 3030336646 Category : Technology & Engineering Languages : en Pages : 155
Book Description
This book tackles important problems of anomaly detection and health status analysis in complex core router systems, integral to today’s Internet Protocol (IP) networks. The techniques described provide the first comprehensive set of data-driven resiliency solutions for core router systems. The authors present an anomaly detector for core router systems using correlation-based time series analysis, which monitors a set of features of a complex core router system. They also describe the design of a changepoint-based anomaly detector such that anomaly detection can be adaptive to changes in the statistical features of data streams. The presentation also includes a symbol-based health status analyzer that first encodes, as a symbol sequence, the long-term complex time series collected from a number of core routers, and then utilizes the symbol sequence for health analysis. Finally, the authors describe an iterative, self-learning procedure for assessing the health status. Enables Accurate Anomaly Detection Using Correlation-Based Time-Series Analysis; Presents the design of a changepoint-based anomaly detector; Includes Hierarchical Symbol-based Health-Status Analysis; Describes an iterative, self-learning procedure for assessing the health status.
Author: Hong-Yue Zhang Publisher: Elsevier ISBN: 9780080555393 Category : Science Languages : en Pages : 1576
Book Description
The safe and reliable operation of technical systems is of great significance for the protection of human life and health, the environment, and of the vested economic value. The correct functioning of those systems has a profound impact also on production cost and product quality. The early detection of faults is critical in avoiding performance degradation and damage to the machinery or human life. Accurate diagnosis then helps to make the right decisions on emergency actions and repairs. Fault detection and diagnosis (FDD) has developed into a major area of research, at the intersection of systems and control engineering, artificial intelligence, applied mathematics and statistics, and such application fields as chemical, electrical, mechanical and aerospace engineering. IFAC has recognized the significance of FDD by launching a triennial symposium series dedicated to the subject. The SAFEPROCESS Symposium is organized every three years since the first symposium held in Baden-Baden in 1991. SAFEPROCESS 2006, the 6th IFAC Symposium on Fault Detection, Supervision and Safety of Technical Processes was held in Beijing, PR China. The program included three plenary papers, two semi-plenary papers, two industrial talks by internationally recognized experts and 258 regular papers, which have been selected out of a total of 387 regular and invited papers submitted. * Discusses the developments and future challenges in all aspects of fault diagnosis and fault tolerant control * 8 invited and 36 contributed sessions included with a special session on the demonstration of process monitoring and diagnostic software tools
Author: Fangming Ye
Author: Fangming Ye
Author: Jingzheng Ren
Author: Michael G. Pecht
Author: Patrick Girard
Author: Qing Duan
Author: Yingmin Jia
Author: S. Ramani
Author: 
Author: Shi Jin
Author: Hong-Yue Zhang