Author: Reiner E. Jargosch
Publisher: IPGenix LLC
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 52
Book Description
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
Texas Instruments Incorporated (TI) Patent Landscape Analysis – January 1, 1994 to December 31, 2013
Author: Reiner E. Jargosch
Publisher: IPGenix LLC
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 52
Book Description
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
Publisher: IPGenix LLC
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 52
Book Description
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
Official Gazette of the United States Patent and Trademark Office
Author: United States. Patent and Trademark Office
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1358
Book Description
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1358
Book Description
Official Gazette of the United States Patent Office
Author: United States. Patent Office
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1226
Book Description
Publisher:
ISBN:
Category : Patents
Languages : en
Pages : 1226
Book Description
Index of Patents Issued from the United States Patent and Trademark Office
ASML HOLDING NV Patent Landscape Analysis – January 1, 1994 to December 31, 2013
Author: Reiner E. Jargosch
Publisher: IPGenix LLC
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 52
Book Description
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
Publisher: IPGenix LLC
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 52
Book Description
The following analysis illustrates the underlying trends and relationships of U.S. issued patents of the subject company. The analysis employs two frequently used patent classification methods: US Patent Classification (UPC) and International Patent Classification (IPC). Aside from assisting patent examiners in determining the field of search for newly submitted patent applications, the two classification methods play a pivotal role in the characterization and analysis of technologies contained in collections of patent data. The analysis also includes the company’s most prolific inventors, top cited patents as well as foreign filings by technology area.
British Business
NASA Patent Abstracts Bibliography
Author: United States. National Aeronautics and Space Administration. Scientific and Technical Information Program
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 654
Book Description
Publisher:
ISBN:
Category : Astronautics
Languages : en
Pages : 654
Book Description
Official Gazette of the United States Patent and Trademark Office
Gazette Du Bureau Des Brevets
Author: Canada. Patent Office
Publisher:
ISBN:
Category : Copyright
Languages : en
Pages : 974
Book Description
Includes annual cumulative index of inventors and patentees.
Publisher:
ISBN:
Category : Copyright
Languages : en
Pages : 974
Book Description
Includes annual cumulative index of inventors and patentees.