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Author: Neal Stollon Publisher: Springer Science & Business Media ISBN: 1441975632 Category : Technology & Engineering Languages : en Pages : 244
Book Description
This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.
Author: Neal Stollon Publisher: Springer Science & Business Media ISBN: 1441975632 Category : Technology & Engineering Languages : en Pages : 244
Book Description
This book provides an in-depth overview of on chip instrumentation technologies and various approaches taken in adding instrumentation to System on Chip (ASIC, ASSP, FPGA, etc.) design that are collectively becoming known as Design for Debug (DfD). On chip instruments are hardware based blocks that are added to a design for the specific purpose and improving the visibility of internal or embedded portions of the design (specific instruction flow in a processor, bus transaction in an on chip bus as examples) to improve the analysis or optimization capabilities for a SoC. DfD is the methodology and infrastructure that surrounds the instrumentation. Coverage includes specific design examples and discussion of implementations and DfD tradeoffs in a decision to design or select instrumentation or SoC that include instrumentation. Although the focus will be on hardware implementations, software and tools will be discussed in some detail.
Author: Thomas Noulis Publisher: CRC Press ISBN: 1138031615 Category : Technology & Engineering Languages : en Pages : 519
Book Description
Noise Coupling is the root-cause of the majority of Systems on Chip (SoC) product fails. The book discusses a breakthrough substrate coupling analysis flow and modelling toolset, addressing the needs of the design community. The flow provides capability to analyze noise components, propagating through the substrate, the parasitic interconnects and the package. Using this book, the reader can analyze and avoid complex noise coupling that degrades RF and mixed signal design performance, while reducing the need for conservative design practices. With chapters written by leading international experts in the field, novel methodologies are provided to identify noise coupling in silicon. It additionally features case studies that can be found in any modern CMOS SoC product for mobile communications, automotive applications and readout front ends.
Author: Gillian McMahon Publisher: John Wiley & Sons ISBN: 9780470518557 Category : Science Languages : en Pages : 318
Book Description
This valuable resource covers the principles of analytical instrumentation used by today's chemists and biologists and presents important advances in instrumentation, such as the drive to miniaturise and lab-on-a-chip devices. In terms of the lab-based analytical instrumentation, the five main categories of technique—spectroscopic, chromatographic, electrochemical, imaging and thermoanalytical, are included and presented in a practical, not theoretical way. Including relevant examples and applications in a number of fields such as healthcare, environment and pharmaceutical industry this book provides a complete overview of the instruments used within the chemistry industry, making this an important tool for professionals and students alike.
Author: Navani J.P. & Sapra Sonal Publisher: S. Chand Publishing ISBN: 9384857408 Category : Technology & Engineering Languages : en Pages :
Book Description
This book is written in a simple and easy-to-understand language to explain the fundamental concepts of the subject. The book presents the subject of EIPC in a comprehensive manner to the students at undergraduate level.This book not only covers the entire scope of the subject but also explains the philosophy of the subject. This makes the understanding of the subject more clear and interesting. The book will be very useful not only to the students but also to the faculty members.
Book Description
This book provides the fundamental concepts of system design using microprocessors in the field of agriculture instrumentation. It begins with an introduction to the field of agriculture and application of instrumentation in agriculture, and the book then covers the transducers specific to the agricultural field. The binary number system and arithmetic are covered as the basic building block of digital circuits and computer organization. The microprocessor basics and Intel 8085 hardware and software have been discussed in detail. The book describes microprocessor peripheral inter-facing and its support chips such as Intel 8225, Intel 8253 and Intel 8279 along with their applications. It discusses analog to digital and digital to analog interface, CRT terminal interface and printer interface. In addition, the book includes case studies on various microprocessor applications in agriculture, such as microprocessor-based system design for grain moisture, safe grain storage, soil nutrient estimation and drip irrigation. Finally, the book ends with an advanced and futuristic topic on precision agriculture to give an exposure to students about future developments in the agricultural system. Key Features : • From concepts to design, the book follows a step-by-step approach. • Gives a large number of figures for easy understanding of theory. • Includes a good number of examples and end-of-chapter exercises both in the hardware and software sections. • Presents a number of case studies on the design of microprocessor-based agri-instrumentation systems. • Offers exercises on the case studies which can be used for further development of the concepts. The book is primarily intended for the undergraduate and postgraduate students of agricultural engineering for their courses on agri instrumen-tation and microprocessor applications in agriculture.
Author: Brian Bailey Publisher: Intl. Engineering Consortiu ISBN: 9781931695572 Category : Business & Economics Languages : en Pages : 516
Book Description
Featuring articles by top experts from such companies as Rambus, IBM, Hewlett-Packard, and FreeScale, this collection addresses the issues that concern those in the ICT field looking to keep systems safe and secure without sacrificing quality or ease of use. This book cogently addresses verification, standards, handoff, and legal issues to create a comprehensive look at one of the most important, yet sometimes under-appreciated, topics in the industry.
Author: C. Shreesha Publisher: Springer Nature ISBN: 9811394199 Category : Technology & Engineering Languages : en Pages : 148
Book Description
This volume contains selected papers which had been presented during CISCON 2018. The papers cover the latest trends in the fields of instrumentation, sensors and systems, industrial automation & control, image and signal processing, robotics, renewable energy, power systems and power drives, with focus on solving the current challenges faced in the field of instrumentation and control engineering. This volume will be of use to academic and industry researchers and students working in this field.
Author: Ravi K. Gulati Publisher: Springer Science & Business Media ISBN: 1461531462 Category : Computers Languages : en Pages : 121
Book Description
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Author: John G. Webster Publisher: CRC Press ISBN: 1351832999 Category : Medical Languages : en Pages : 2273
Book Description
This new edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences; explains sensors and the associated hardware and software; and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Second Edition: Consists of 2 volumes Features contributions from 240+ field experts Contains 53 new chapters, plus updates to all 194 existing chapters Addresses different ways of making measurements for given variables Emphasizes modern intelligent instruments and techniques, human factors, modern display methods, instrument networks, and virtual instruments Explains modern wireless techniques, sensors, measurements, and applications A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition provides readers with a greater understanding of advanced applications.
Author: Neal Stollon
Author: Neal Stollon
Author: Waqar Ahmed Qureshi
Author: Thomas Noulis
Author: Gillian McMahon
Author: Navani J.P. & Sapra Sonal
Author: KRISHNA KANT
Author: Brian Bailey
Author: C. Shreesha
Author: Ravi K. Gulati
Author: John G. Webster