Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas PDF Download

Author: Channing C. Ahn
Publisher: John Wiley & Sons
ISBN: 3527604774
Category : Science
Languages : en
Pages : 472

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Book Description
This book/CD package provides a reference on electron energy loss spectrometry (EELS) with the transmission electron microscope, an established technique for chemical and structural analysis of thin specimens in a transmission electron microscope. Describing the issues of instrumentation, data acquisition, and data analysis, the authors apply this technique to several classes of materials, namely ceramics, metals, polymers, minerals, semiconductors, and magnetic materials. The accompanying CD-ROM consists of a compendium of experimental spectra.

Author: Minerals, Metals and Materials Society Staff
Publisher:
ISBN: 9780608200309
Category :
Languages : en
Pages : 284

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Book Description

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 038776500X
Category : Science
Languages : en
Pages : 804

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Book Description
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

Author: Rik Brydson
Publisher: Springer Verlag
ISBN: 9780387916149
Category : Science
Languages : en
Pages : 160

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Book Description
This is an introductory practical guide to the use of Electron Energy Loss Spectroscopy (EELS) in the laboratory. EELS is a technique used in the transmission electron microscope, in materials or physical science laboratories, to examine the microstructure and characteristics of materials. An ideal starting point for newcomers to the area, Electron Energy Loss Spectroscopy allows first-time users to fully understand the technique and to appreciate how useful results can be obtained.

Author:
Publisher: Elsevier
ISBN: 008101984X
Category : Science
Languages : en
Pages : 5142

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Book Description
The third edition of the Encyclopedia of Analytical Science, Ten Volume Set is a definitive collection of articles covering the latest technologies in application areas such as medicine, environmental science, food science and geology. Meticulously organized, clearly written and fully interdisciplinary, the Encyclopedia of Analytical Science, Ten Volume Set provides foundational knowledge across the scope of modern analytical chemistry, linking fundamental topics with the latest methodologies. Articles will cover three broad areas: analytical techniques (e.g., mass spectrometry, liquid chromatography, atomic spectrometry); areas of application (e.g., forensic, environmental and clinical); and analytes (e.g., arsenic, nucleic acids and polycyclic aromatic hydrocarbons), providing a one-stop resource for analytical scientists. Offers readers a one-stop resource with access to information across the entire scope of modern analytical science Presents articles split into three broad areas: analytical techniques, areas of application and and analytes, creating an ideal resource for students, researchers and professionals Provides concise and accessible information that is ideal for non-specialists and readers from undergraduate levels and higher

Author: R.F. Egerton
Publisher: Springer Science & Business Media
ISBN: 1441995838
Category : Technology & Engineering
Languages : en
Pages : 498

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Book Description
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

Author: R. Brydson
Publisher: Garland Science
ISBN: 1000102319
Category : Science
Languages : en
Pages : 150

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Book Description
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.

Author: Brent Fultz
Publisher: Springer Science & Business Media
ISBN: 3642297617
Category : Science
Languages : en
Pages : 764

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Book Description
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Author: Grant Henderson
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 161451786X
Category : Science
Languages : en
Pages : 818

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Book Description
Spectroscopic Methods in Mineralogy and Material Science covers significant advances in the technological aspects and applications of spectroscopic and microscopic techniques used in the Earth and Materials Sciences. The current volume compliments the now classic Volume 18, Spectroscopic Methods in Mineralogy and Geology, which became an essential resource to many scientists and educators for the past two decades. This volume updates techniques covered in Volume 18, and introduces new techniques available for probing the secrets of Earth materials, such as X-ray Raman and Brillouin spectroscopy. Other important topics including Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM) are also covered.

Author: Linda Sawyer
Publisher: Springer Science & Business Media
ISBN: 0387726284
Category : Science
Languages : en
Pages : 568

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Book Description
This extensively updated and revised Third Edition is a comprehensive and practical guide to the study of the microstructure of polymers. It is the result of the authors' many years of academic and industrial experience. Introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy are considered. The book closes with a problem solving guide.